TY  - CONF

T1  - Calibration of thickness-dependent k-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy

CY  - Bristol

JO  - Journal of Physics: Conference Series

PY  - 2013/01/01

AU  - Qiu Y

AU  - Nguyen VH

AU  - Dobbie A

AU  - Myronov M

AU  - Walther T

ED  - Walther T

ED  - Hutchison JL

DO  - DOI: 10.1088/1742-6596/471/1/012031

PB  - Institute of Physics Publishing

VL  - 471

SP  - 012031

EP  - 1

Y2  - 2024/12/22

ER  -