@article{article, title  = {{A comparative study of epitaxial InGaAsBi/InP structures using Rutherford backscattering spectrometry, X-ray diffraction and photoluminescence techniques}},

 publisher = {{AIP Publishing}},

 url = {{http://eprints.whiterose.ac.uk/152938/ }},

 year = {{2019}},

 month = {{9}},

 author = {{Sharpe MK and Marko IP and Duffy DA and England J and Schneider E and Kesaria M and Fedorov V and Clarke E and Tan CH and Sweeney SJ}},

 doi = {{10.1063/1.5109653}},

 volume = {{126}},

 journal = {{Journal of Applied Physics}},

 issue = {{12}},

 note = {{Accessed on 2024/12/22}}}