@article{article, title = {{A comparative study of epitaxial InGaAsBi/InP structures using Rutherford backscattering spectrometry, X-ray diffraction and photoluminescence techniques}}, publisher = {{AIP Publishing}}, url = {{http://eprints.whiterose.ac.uk/152938/ }}, year = {{2019}}, month = {{9}}, author = {{Sharpe MK and Marko IP and Duffy DA and England J and Schneider E and Kesaria M and Fedorov V and Clarke E and Tan CH and Sweeney SJ}}, doi = {{10.1063/1.5109653}}, volume = {{126}}, journal = {{Journal of Applied Physics}}, issue = {{12}}, note = {{Accessed on 2025/04/10}}}