TY  - JOUR

T1  - Temperature dependence of impact ionization in submicrometer silicon devices

JO  - IEEE Transactions on Electron Devices

PY  - 2006/01/01

AU  - Massey DJ

AU  - David JPR

AU  - Rees GJ

ED  - 

DO  - DOI: 10.1109/TED.2006.881010

VL  - 53

IS  - 9

SP  - 2328

EP  - 2334

Y2  - 2024/12/22

ER  -